The full scale mass market for flash storage has started here and now. It is my firm belief that
the golden age of flash storage has come as indicated by the scale-up of eMMC used for
smartphones and tablets, popularization of SSDs for PCs, explosive growth of server storage
for big data processing and introduction of flash storage for vehicles.

Since its establishment in 2009, our company has grown into what our company name “
Elixir Flash Technology” stands for, whose implicit intention is providing total solutions for
flash storage. We’ve been dedicated to being a world best provider of powerful testing
solutions for storage stability and performance, as well as flash storage-based system perfor
mance acceleration technology. As a result, we started to provide our flash storage solutions
to domestic and overseas semiconductor manufacturers and mobile phone manufacturers
and we are on the verge of reaching one million dollar export milestone in 2015.

Our company’s final goal is providing smartphone and vehicle users with fast processing
speed and solutions for safe data preservation through powerful testing and performance
boosting technologies for flash storages.

Our company’s goal is to become a global company based on our core technologies. Today,
as usual, we go forward step by step while respecting our company’s human resources who
dream a better tomorrow through ongoing self-development and are dedicated to achieving
daily goals as one of our company’s core values.

Andrew Lee, CEO of EFTech


Basic Profile

Name Elixir Flash Technology Address #711, 3-9, Seongnam-daero 331beon-gil, Bundang-gu, Seongnam-si,
Gyeonggi-do, Korea (Jeongja-dong)
CEO & Founder Andrew Lee, Doctor of Engineering Engineers 10
Start date 2009.9 URL www.elixirflash.com

2015
  • 09 Provided eMMC Test Platform for LG Mobile
  • 01 Launched EF DDR Tester 1000
2014
  • 10 Launched EF eMMC Tester 2000 : support temperature cycle testing
  • 07 Patent registration : Non-volatile memory system and mapping table management method for it
  • 06 Participated in government project for UFS controller (2 years)
    : “Development of UFS 2.0 control device and embedded software for mobile storages”
  • 05 Patent registration : A control device for non-volatile memories and its control methods
  • 01 Launched EF eMMC Tester 1000
2013
  • 09 Registered as a partner company of LG Electronics
  • 01 Patent registration : A memory system and its memory mapping method
2012
  • 09 Quality management system certified to ISO9001
  • 05 Participated in government project for new memory system software (5 years)
    : “Development of path-breaking technology for embedded system software for next generation memory based smart devices”
2011
  • 11 Established Corporate R&D Center
  • 06 Registered as a partner company for SK Hynix
2010
  • 11 Received a prize for encouragement from the Contest of Best Practices hosted by Korea Institute of Startup
    & Entrepreneurship Development
  • 11 Registered as a partnership company of Samsung Electronics
  • 06 Certified Venture Company
2009
  • 09 Founded Company

Certificate

  • Management System
    Certificate
  • Venture Business Certificate
  • Corporate R&D
    Center Accreditation
  • Program Registration
    Certificate
  • Program Registration
    Certificate
  • Program Registration
    Certificate

  • Patent Certificate

  • Patent Certificate

  • Patent Certificate

  • Patent Certificate

  • Patent Certificate

  • Patent Certificate

  • Patent Certificate

Address
28 Hwangsaewul-ro 200 Beon-gil, Bundang-gu, Seongnam-si,
Gyeonggi-do (#707 Owner’s Tower, Sunae-dong)
Phone number
+82-31-609-9972
E-mail
ef@elixirflash.com

Product

Flash storage testing

  • EF eMMC Tester for Consumer
  • EF eMMC Tester for Automotive
  • Testing Technology

We provide hardware and software integrated platforms for powerful and fast
testing by gray-box testing algorithm based on the knowledge of inner algorithms
of eMMCs and SSDs.

EF eMMC Tester I for
Consumer Device

EF eMMC Tester is AP (application processor) based
test equipment under room temperature. This solution
consists of a maximum 64 sets of embedded boards
with a single built-in eMMC socket and control PC.
It’s major testing items are as follows:

  • Smart power-cycle test
  • Device endurance test
  • Performance benchmark
  • System level compliance test

The control program, the EF-monitor, consists of a
Windows GUI program that allows one-click program
execution, which allows users to conduct testing and
monitoring a maximum of 64 eMMC devices. It offers
functions such as failure analysis on damaged data
blocks when an error occurs, e-mail transmission of
error-related information and saving it to database.
Moreover, it is designed so as to provide easy
environment to develop a new test case.

The core technology of the tester is the test cases set
which consists of more than 50 test cases to implement
various ideas for gray-box testing.
They are implemented not only on the driver level, but
also on system level running on the file system to
provide a testing environment similar to an actual
system. Besides the test cases, the control protocol that
controls multiple boards is one of the core technologies
to realize a mass testing platform.

E-bench for performance evaluation is the world’s first
Android app-based storage benchmarking program.
This program not only measures the app’s performing
speed and UI conversion speed, but also measures
command running time for the eMMC device, and
analyze the correlation of UI speed and device speed
by automatically performing camera shooting, web
approach, etc. in repetition. For more correct
performance evaluation, it is capable of providing a
similar testing environment as the actual user
environment by measuring the dirty status as
well as clean status of device

We provide hardware and software integrated platforms for powerful and fast
testing by gray-box testing algorithm based on the knowledge of inner algorithms
of eMMCs and SSDs.

EF eMMC Tester II
for Automotive

EF eMMC Tester II is chamber-based stability/endurance
testing equipment used for automotive eMMC testing.
The testing scenario conducts fast I/O testing under
temperatures of -25ºC~ 85ºC and storage testing under
extreme temperature conditions (-40ºC-100ºC).
For this purpose, this tester consists of an FPGA-type
eMMC host controller, test board with built-in 8 eMMC
sockets and PC program that controls multiple boards.

The eMMC Tester II is capable of conducting
power-cycle tests under high or low temperature
conditions, which simulates a similar testing
environment of eMMC device used for in-vehicle
devices that operate under extreme temperature.
The burn-in test equipment in the test chamber
minimizes testing time and maximizes coverage as it
allows users to actually reproduce bad blocks in an
eMMC in mass that occur during repetitive uses and
easily test the management of the eMMC controller
against them.

We provide hardware and software integrated platforms for powerful and fast
testing by gray-box testing algorithm based on the knowledge of inner algorithms
of eMMCs and SSDs.

Patented Smart
Testing Technology

As semiconductor processing technology advances, the
capacity/price ratio of flash memory doubles each year,
but the quality become worse than 200% per year.
The quality of the NAND cell itself is shown by the fact
that the PE cycles limitation (program/erase cycles) of
TLC is only 500 times, which shows how weak
NAND-based flash storage is. However, its areas of
application are expanding from smartphone storage to
vehicle infotainment systems with built-in OS platforms
such as Android. Therefore, the necessity of strong
quality test is increasing.

Our company’s patented smart testing technology is
enabled by gray-box testing technology based on our
knowledge of the firmware of flash storage.
For example, for the power-off test, the hardware and
software of our testing platform is developed to induce
the tested storage to frequently show intervals of
weakness of the firmware, recognize the interval as a
vulnerable one and execute the power-off instruction.
With this technology, our platform enables
semiconductor manufacturers and set manufacturers
to achieve more than 10 times faster testing speed
compared to existing equipment and make a
big cost-reduction effect.

Product

Flash Host Software

This software maximizes the performance of a large capacity storage system
based on flash storage and secures the stability of the embedded system based on
flash storage using host software technology.

Flash Storage Caching
System, EF-Keepfast

This solution is software layer for mobile devices and
desktops that maximizes the speed of large capacity
storage by using a local flash storage (eMMC or SDD)
as cache. This allows user to use a local cloud storage
at a fast speed as if it is a local disk.
Even though personal users have a large volume of
data such as multimedia data, they only access limited
amount of data at a certain point in time. Therefore,
this system provides a 10TB high speed storage system
for users since a small flash cache can handle 99.9% of
data traffic.

The EF-Keepfast realized as a virtual block drive is rec-
ognized as a large capacity disk by host system. But,
the host has only a 64GB or 128GB eMMC(or SSD)
cache and uses remote cloud server as the large
capacity disk. The smart cache algorithm that utilizes
hot data separation technology, data approach estima-
tion technology, etc. can maximize the hit ratio of the
small capacity local storage.

Highly Stable
File System, EF-FAT

This file system is a power fail tolerant file system that is
optimized to SD card-based embedded devices such as
car black boxes. This highly stable FAT file system that
passed our company’s stringent testing environments
allows user to save data safely such as recent recorded
video to flash storage, against all possible accidents.

The special features of this file system are as follows:
1) From a safety point of view, users can safely save
the last saved data even when the SD is separated by
user mistake or impact from an accident during
operations, and 2) from a performance point of view,
it offers the feature to maximize the SD card’s perfor-
mance by generating the host traffic in sequential pattern.

Storage Traffic
Analyzer: EF-STAN

This is an windows program which shows the delay
time and access address, etc. for each storage
command in GUI forms and allows users to make
statistics and conduct analysis. This program is a useful
tool for memory development engineers and evaluation
engineers of mobile phone manufacturers as it allows
them to evaluate the storage’s performance of and
understand its characteristics. This program shows the
distribution and statistics of latencies by flash command
and distribution of the access addresses on logical
address space.

File System Analyzer:
EF-Parser

This world’s first Windows GUI-based ext4-parser is a
tool for conducting an analysis in the case a file system
crash occurs due to an eMMC failure or file system
failure. When a crash of meta-data or journal-data of a
file system occurs, this program allows users to access
the target sector and conduct an analysis on it by
clicking the inode on the list, or perform the sector
analysis function to perform an analysis on previous
and successive data of the crash data. It offers a
top-down access function to access specific files by
using the inode data of the file and directory, and
bottom-up access function to find a file or directory by
using a sector address.

Product

Flash firmware

This FTL, which is specialized for TLC eMMC, maximizes the endurance and per-
formance of the eMMC since FTL receives property information of data from the
host and use it for efficient management of the data.

Host Aware FTL :
EF-FTL

The EF-FTL maximizes the performance and endurance
of the memory using host data. The first version of the
EF-FTL is optimized to f2fs (flash friendly file system), a
new Linux file system, and enhances the performance
and endurance by employing an inner FTL log buffer
management technique interlocked to the log buffer
management technique of f2fs. The idea is to reduce
garbage collection cost by aligning data of a similar
access cycle to physically near space. The method to
realize this idea is to place hot or cold marks on storage
data not only in the FTL dedicated to f2fs but also in
the ext4 file system and deliver it to the storage so that
the storage can use it for its internal operation.

Flash storage
simulator

This is a simulator for developing eMMC, SSD, etc. This
simulator offers performance evaluation function based
on the numbers of read/program/erase and latencies in
consideration of the parallelism of various levels inside
the storage. This simulator calculates the latency of
individual command language considering all the
following – system parallelism achieved in the storage’s
cache mode, multi-channel parallelism achieved in
multiple NAND operation on multiple channels, single-
channel parallelism in a channel achieved by multiple
NAND operation, device’s parallelism achieved by
multi-plane command language, NAND cache
read/write, etc.